Variants of an Improved Carry Look - Ahead
نویسنده
چکیده
We consider the design of two well-known optimal timeadders: the “carry look-ahead” adder [6] and the “conditional sum”adder 1131.It is shown that 6 log,(n) 4 and 6 log2(n) + 2 test patterns suffice tocompletely test the n-bit carry look-ahead adder and the n-bit conditionalsum adder with respect to the single stuck-at fault model (for a given setof basic cells).
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